Working Memory
Digit Span Test
Assess verbal working-memory span with adaptive forward and backward digit recall in the browser.
Useful for neuropsychology-inspired batteries, cognitive screening research, and memory-capacity studies.
What this task measures
Measures verbal working memory capacity by asking participants to recall sequences of digits in forward and backward order.
Core constructs
- Verbal working memory capacity
- Phonological loop
- Mental manipulation (backward)
- Serial recall
- Executive working memory (backward)
Research fit
- Intellectual disability assessment
- Dementia screening (WAIS subtest)
- Learning disability evaluation
- Traumatic brain injury assessment
- Pre/post intervention measurement
Why researchers use ConductCognition
- Hosted browser delivery with no local install burden for participants.
- Study setup, scoring, exports, and participant links in one workflow.
- Transparent pricing instead of opaque enterprise quoting for solo labs.
- Free entry tier plus Academic Pro when you need the full battery and raw exports.
Paradigm overview
The Digit Span Test measures verbal working memory capacity using an adaptive staircase procedure. In the forward phase, participants view a sequence of digits (1-9) presented one at a time and must type them back in order. In the backward phase, they must recall the digits in reverse order.
The test starts at a span of 3 digits and increases by one digit after successful recall. Two trials are given at each span length; the participant must pass at least one to advance. The test terminates when both trials at a span length are failed, or when the maximum span (9) is reached.
Forward span primarily taps the phonological loop component of working memory (passive maintenance and rehearsal). Backward span additionally requires mental manipulation and reordering, engaging executive working memory processes. The forward-backward difference isolates executive contribution to working memory performance.
Key scoring outputs
Forward Span
scoreLongest digit sequence correctly recalled in forward order. Primary capacity measure.
Higher is better
Backward Span
scoreLongest digit sequence correctly recalled in reverse order. Null if backward phase not included.
Higher is better
Total Score
scoreForward span + backward span. Composite working memory measure.
Higher is better
Longest Forward
scoreSame as forward span. Maximum sequence length achieved.
Higher is better
Longest Backward
scoreSame as backward span. Maximum reverse sequence length achieved.
Higher is better
Normative and citation context
Woods DL, Kishiyama MM, Yund EW, Herron TJ, Edwards B, Poliva O, Hink RF, Reed B (2011). Improving digit span assessment of short-term verbal memory. Journal of Clinical and Experimental Neuropsychology, 33(1):101-111.
Computerized digit span (forward only). Backward span norms less established in computerized format.
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